+1 978-843-7670
Who We Are
Management Team
Press Releases

Management Team

Tom McNabb

President and Chief Executive Officer

Tom joined MicroSense’s predecessor, ADE Technologies, Inc. (ATI), in 2003, as Vice President and General Manager. After KLA-Tencor acquired ADE in 2006 and sold ATI to MicroSense in 2009, Tom became President & COO. From 2000 to 2003, Tom was Vice President and General Manager of the Pressure Measurement and Control Products Division at MKS Instruments. From 1997 to 2000, Tom held Vice President of Engineering and General Management positions at PRI Automation (now Brooks Automation). From 1983 to 1997, Tom held various global management positions in business development, marketing, applications engineering, and operations at Texas Instruments. Tom has a Bachelor of Science degree in Civil Engineering from the University of Vermont.

Peter Bagley

Director - Wafer Geometry Metrology Business

Peter is responsible for the marketing and sales of MicroSense precision wafer geometry metrology systems. His has more than 25 years of experience in marketing and sales of wafer metrology, industrial automation, precision stages and motion control products. Peter joined MicroSense, then ADE Corporation, in 2004. Prior to joining ADE, Peter spent seven years at Instrument Industries, ultimately acquired by Danaher Motion, a leading manufacturer of high precision stages and motion control systems. He was responsible for establishing strategic relationships with leading OEM manufacturers of semiconductor and flat panel manufacturing equipment. Peter has a BS in Econometrics from Suffolk University in Boston, Massachusetts.

David Kallus

Director – Wafer Dimensional Metrology Business

David is responsible for the Wafer Dimensional Metrology Business of MicroSense, formerly known as SigmaTech. Prior to joining MicroSense in 2012, David was a Sr. Director of KLA-Tencor’s Process Control Information Division. David held various management positions in marketing and engineering at ADE from 1989 to 2006 prior to KLA-Tencor’s acquisition of ADE in 2006. David has a Bachelor of Science degree in Electrical Engineering from the University of Massachusetts and an MBA from Northeastern University.

Erik Samwel

Director - VSM Business

Erik joined the predecessor to MicroSense, DMS, in 1996 as a principal scientist before becoming product manager in 2002 and Director of the VSM business in 2009. Prior to joining DMS, Erik built his first Vibrating Sample Magnetometer system while doing his PhD research in 1992. Erik has a PhD and a MSc in electrical engineering from the University of Twente in the Netherlands.

Ferenc Vajda

Director - Magnetic Metrology Business

Ferenc was born in Budapest, Hungary. He received the M.Sc. (EE) degree from the Technical University of Budapest in 1988, and the D.Sc. degree from the George Washington University in 1992. From 1992 to 1996 he was a research scientist and assistant professor at the George Washington University. He joined Digital Measurement Systems (DMS) in 1996. Since then he has held various technical and technical management positions at ADE Corp (acquired DMS in 1997), KLA-Tencor (acquired ADE Corp in 2006) and MicroSense, LLC (spun off from KLA-Tencor in 2009), leading to his current position as Director of Magnetic Metrology. He has been involved in the design of every magnetic metrology system by these companies for LMR/PMR/HAMR media, GMR/TMR head stacks, as well as in-plane and perpendicular MRAM. He is the author of over 45 refereed publications and holds 2 patents.

Mike Paragona


Mike joined MicroSense’s predecessor, ADE Technologies, Inc., in 1995 as a Staff Accountant. He worked in a variety of accounting roles before becoming Controller of MicroSense in 2009. Prior to working at ADE, Mike worked at ACSYS, Inc., a subsidiary of AMP Inc., as a General Accountant and also worked at a CPA firm for a few years. Mike has a BS in Accounting from Bentley College.