About MicroSense

MicroSense has a singular focus on precision measurement.  We provide customers with state-of-the-art measurement performance in our products - precision capacitive sensors for high resolution, non-contact position sensing; vibrating sample magnetometers and MOKE systems for magnetic property measurement; and SigmaTech wafer metrology systems for complete wafer characterization.   

Non-Contact Linear Capacitive Sensors

MicroSense® non-contact capacitive sensors are ideal for precise, linear position  measurements and linear displacement sensing.

  • Completely non-contact linear position sensor displacement measurement technology
  • Detection of any conductive, grounded target – surface finish has no effect on accuracy
  • Optimized for short measurement ranges – 10 micrometers to 5 millimeters
  • Capacitive sensors are the most accurate electrical position sensors, 0.02% full scale linearity is possible

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Vibrating Sample Magnetometer

Our award winning Vibrating Sample Magnetometers are the easiest to use and most sensitive VSMs available.

  • Measure the moment and coercivity of thin films.
  • Study the magnetic properties of liquids, powders or bulk samples.
  • State-of-the-art accuracy in absolute magnetic measurements.
  • Unmatched flexibility - suitable for measuring samples with a very low coercivity as well as samples with high coercivities.
  • Unrivaled real-time field control system, low noise performance - makes measurements possible on samples that can not be measured in other commercial electromagnet based VSMs.

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Magnetic Metrology

MicroSense offers a suite of automated magnetic metrology tools to meet the stringent demands of the Data Storage & Semiconductor industries including -

  • Polar Kerr for MRAM -- Polar Kerr effect-based, non-contact measurement of the magnetic properties of Perpendicular MRAM Wafers 
  • KerrMapper -- perform non-contact mapping of the magnetic properties of in-plane MRAM, GR, GMR TMR and other wafers up to 300 mm
  • DiskMapper H7 -- non-contact measurement of the magnetic properties of HAMR TAR disks at fields up to 7 Tesla to provide deposition process control
  • Polar Kerr for PMR Disk -- Polar Kerr effect-based non-destructive, non-contact measurement of the magnetic properties of PMR media

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Break the nanometer resolution barrier with our MicroSense 6810 position sensor!

Nanometer resolution for precision actuators, over ranges up to 200 µm, with MicroSense Mini nanopositioning sensor!