Magnetic Metrology Systems for Magnetics Properties MeasurementMicroSense designs, manufactures & supports a wide range of automated magnetic metrology tools used by the Data Storage & Semiconductor industries. The systems currently available are listed below:
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Polar Kerr -- Polar Kerr effect-based non-destructive, non-contact measurement of the magnetic properties of PMR media |
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KerrMapper -- The KerrMapper S300 and V300 perform non-contact mapping of the magnetic properties of MRAM, MR, GMR, TMR and other wafers up to 300mm |
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DiskMapper M3 -- The DiskMapper M3 measures the uniformity of critical magnetic properties, such as the remanence thickness product (Mrt), the remanence coercivity (Hr), and the remanent nucleation field (Hnr), providing feedback for deposition process control. |
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Vibrating Sample Magnetometer -- The Vibrating Sample Magnetometers are our most versatile systems for measuring the absolute moment, coerciivty and a wide range of other magnetic properties both at room temperature and at low or high temperatures for virtually all types of magnetic materials. |
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