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Magnetic Metrology Systems for Magnetics Properties Measurement

MicroSense designs, manufactures & supports a wide range of automated magnetic metrology tools used by the Data Storage & Semiconductor industries. The systems currently available are listed below:

Polar Kerr for MRAM -- Polar Kerr effect-based non-destructive, non-contact measurement of the magnetic properties of Perpendicular MRAM Wafers
Polar Kerr for PMR Media  -- Polar Kerr effect-based non-destructive, non-contact measurement of the magnetic properties of PMR Media

KerrMapper -- The KerrMapper S300 and V300 perform non-contact mapping of the magnetic properties of MRAM, MR, GMR, TMR and other wafers up to 300mm

DiskMapper H7 -- non-contact measurement of the magnetic properties of HAMR TAR disks at fields up to 7 Tesla to provide feedback for deposition process control

Vibrating Sample Magnetometer -- The Vibrating Sample Magnetometers are our most versatile systems for measuring the absolute moment, coerciivty and a wide range of other magnetic properties both at room temperature and at low or high temperatures for virtually all types of magnetic materials.