Magnetic Metrology Systems for Magnetics Properties MeasurementMicroSense designs, manufactures & supports a wide range of automated magnetic metrology tools used by the Data Storage & Semiconductor industries. The systems currently available are listed below:  | Polar Kerr for MRAM -- Polar Kerr effect-based non-destructive, non-contact measurement of the magnetic properties of Perpendicular MRAM Wafers
Polar Kerr for PMR Media -- Polar Kerr effect-based non-destructive, non-contact measurement of the magnetic properties of PMR Media | | |
 | KerrMapper -- The KerrMapper S300 and V300 perform non-contact mapping of the magnetic properties of MRAM, MR, GMR, TMR and other wafers up to 300mm |
 | DiskMapper H8 -- non-contact measurement of the magnetic properties of HAMR TAR disks at fields up to 8 Tesla to provide feedback for deposition process control |
| Vibrating Sample Magnetometer -- The Vibrating Sample Magnetometers are our most versatile systems for measuring the absolute moment, coercivity and a wide range of other magnetic properties both at room temperature and at low or high temperatures for virtually all types of magnetic materials. |
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