ProcessView Wafer Visualization and Analysis System
A Powerful Analysis Tool for Fab Engineers - Capture Real-Time Wafer Data and Wafer Maps to Reduce Scrap and Rework
Benefits of ProcessView
- Visualize Large Wafer Datasets
- Compare Wafers Measured at Multiple Process Steps
- Connect Multiple MicroSense Wafer Metrology Systems to a common Data Server
ProcessView continuously monitors MicroSense diimensional wafer measurement systems, capturing data and wafer maps in real-time. ProcessView is a client server enterprise solution comprising a powerful backend MySQL database. The ProcessView client allows multiple process engineers to simultaneously query, retrieve analyze and compare wafer quality.

Features
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Wafer Query
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Visual Wafer Gallery
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Wafer Map Viewer
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PDF Report Generator
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CSV Data Export
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Query By Lot, Wafer ID, Date, Range, Measurement Value |
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Load, Sort and Filter Measurement Data |
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Powerful Wafer Gallery |
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PDF Report Generator |
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