ProcessView Wafer Visualization and Analysis System

A Powerful Analysis Tool for Fab Engineers - Capture Real-Time Wafer Data and Wafer Maps to Reduce Scrap and Rework

Benefits of ProcessView

• Visualize Large Wafer Datasets
• Compare Wafers Measured at Multiple Process Steps
• Connect Multiple MicroSense Wafer Metrology Systems to a common Data Server

ProcessView continuously monitors MicroSense diimensional wafer measurement systems, capturing data and wafer maps in real-time.  ProcessView is a client server enterprise solution comprising a powerful backend MySQL database. The ProcessView client allows multiple process engineers to simultaneously query, retrieve analyze and compare wafer quality.
 

Features

• Wafer Query

• Visual Wafer Gallery

• Wafer Map Viewer

• PDF Report Generator

• CSV Data Export

Query By Lot, Wafer ID, Date, Range, Measurement Value				Load, Sort and Filter Measurement Data
Powerful Wafer Gallery				PDF Report Generator