Together we will keep thinking big about
measuring Small things
MicroSense is now part of KLA
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Precision Capacitive
Sensors
MicroSense non-contact capacitive sensors are ideal for precise, linear position measurements and linear displacement sensing
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Solar Wafer Thickness
Measurement
MicroSense in-line measurement modules offer unparalled throughput and stability for measurement of solar wafer thickness and TTV.
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Vibrating Sample
Magnetometer
Our award winning Vibrating Sample Magnetometers are the easiest to use and most sensitive VSMs available.
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MRAM Magnetic Metrology
MicroSense offers a suite of automated magnetic measurement tools for in-plane and perpendicular STT-MRAM development and production including:
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Dimensional Wafer
Metrology Systems
Wafer measurement systems from MicroSense provide precise measuremet of wafer thickness and shape. Ideal for materials including sapphire, silicon, GaAs, InP, and SiC.
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